Methods for Characterizing Defects in Advanced Manufacturing Processes

Participant List

29 participants

First Name	Last Name	Affiliation
Aeriel	Murphy-Leonard	US Naval Research Laboratory
Alkan	Donmez	NIST
Andrew	Chuang	Advanced Photon Source
Anthony	Rollett	Carnegie Mellon Univ.
Atieh	Moridi	Cornell University
Dan	Thoma	University of Wisconsin-Madison
Darren	Pagan	Cornell High Energy Synchrotron Source
David	Rowenhorst	The US Naval Research Lab
Don	Brown	Los Alamos National Laboratory
Hassan	Ghassemi-Armaki	Lead Research Engineer
Jenniffer	Bustillos	Cornell University - LAMM
Jinyeon	Kim	Cornell University
John	Carpenter	Los Alamos National Laboratory
John	Lewandowski	Case Western Reserve University
John	Speer	Colorado School of Mines
Jun-Sang	Park	Argonne National Labortory
Keith	Brady	Speaker
Kelly	Nygren	Cornell High Energy Synchrotron Source
Kevin	Stone	SLAC National Accelerator Laboratory
Lewei	He	Cornell University
Matthew	Miller	Cornell University
Mostafa	Hassani	MAE Cornell
Nik	Chawla	Arizona State University
Peter	Lee	University College London
Qi	An	Cornell University
Rahul	Alreja
Thomas	Broderick	USAF AFRL/RXMS
Yan	Gao	GE Research
1 more participant