Methods for Characterizing Defects in Advanced Manufacturing Processes

Oct 14, 2019, 8:00 AM → Oct 15, 2019, 5:00 PM America/New_York

401 (Physical Sciences Building)

Darren Pagan (Cornell High Energy Synchrotron Source), John Carpenter (Los Alamos National Laboratory)

WORKSHOP GOALS:

For the characterization community to inform the manufacturing industry on cutting edge research with in situ and ex situ characterization capabilities and how they have been helpful in solving industrial challenges.

For the manufacturing industry to provide invaluable direction to the characterization community on where to focus resources with regards to experimental development for model validation or part qualification/acceptance.

To identify experiments in a formal report that can meet current industrial needs and that will stretch current characterization capabilities.

WORKSHOP FEATURES:

1. Industrial Panel Discussion
2. Invited Talks
3. Breakout Sessions
4. Tours of the CHESS Facility and Beamlines

ORGANIZERS:

• Jon Almer (ANL)
• Don Brown (LANL)
• John Carpenter (LANL)
• Andrew Chuang (ANL)
• Jason Cooley (LANL)
• Matthew Miller (Cornell)
• Kelly Nygren (Cornell)
• Darren Pagan (Cornell)
• Jun-Sang Park (ANL)
• Dan Thoma (University of Wisconsin)

 

LANL Workshop v04(1).jpg

Workshop Agenda_10_7_19 for distro.pdf

Monday, October 14

8:00 AM → 8:20 AM Registration

Registration - Coffee

8:20 AM → 8:25 AM Welcome

Welcome - Participants setting up wifi, review of agenda

Convener: Darren Pagan (Cornell University)