Speaker
Mr
Jin-Sung Kim
(Cornell University)
Description
Measuring secondary electron yields (SEYs) on technical surfaces in accelerator vacuum systems provides essential information for many accelerator R&D projects, such as the ILC Damping Rings, regarding to electron cloud growth and suppression. As a part of CesrTA research program, we developed and deployed SEY in-situ measurement systems. Two such SEY systems were installed to expose samples with direct and scattered synchrotron radiation (SR), and the SEYs of the samples were measured as a function of SR dosages. In this poster, we describe the in-situ SEY measurement systems and the initial results on bare aluminum and TiN-coated aluminum samples.
Primary author
Mr
Jin-Sung Kim
(Cornell University)
Co-authors
Dr
David Asner
(Cornell University)
Mr
Joe Conway
(Cornell University)
Dr
Mark Palmer
(Cornell University)
Dr
Shlomo Greenwald
(Cornell University)
Mr
Tobey Moore
(Cornell University)
Mr
Valeri Medjidzade
(Cornell University)
Dr
Yulin Li
(Cornell University)
